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Design for testability of integrated operational amplifiers using oscillation-test strategy

Karim Arabi, Bozena Kaminska and Stephen Sunter

Paper (1996)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/31565/
Conference Title: 1996 International Conference on Computer Design, ICCD'96
Conference Location: Austin, TX, USA
Conference Date(s): 1996-10-07 - 1996-10-09
Publisher: IEEE
DOI: 10.1109/iccd.1996.563529
Official URL: https://doi.org/10.1109/iccd.1996.563529
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Arabi, K., Kaminska, B., & Sunter, S. (1996, October). Design for testability of integrated operational amplifiers using oscillation-test strategy [Paper]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. https://doi.org/10.1109/iccd.1996.563529

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