Documents dont l'auteur est "Caron, M."

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Aller à : 1999 | 1998 | 1997 | 1996 | 1995 | 1994

Nombre de documents: 20

1999

Boone, F., Hindson, D., Caron, M., Abdulnour, J., & Wu, K. Design and properties of integrated millimeter-wave bandpass filters using nonradiative dielectric waveguide for broadband wireless system [Communication écrite]. Gigahertz Devices and Systems. Lien externe

1998

Fortin, V., Gagnon, G., Caron, M., Gujrathi, S. C., Currie, J. F., Ouellet, L., Tremblay, Y., & Biberger, M. (1998). The determination of phases formed in AlSiCu/TiN/Ti contact metallization structure of integrated circuits by x-ray diffraction. Journal of Applied Physics, 83(1), 132-138. Lien externe

Gujrathi, S. C., Gagnon, G., Fortin, V., Caron, M., Currie, J. F., Ouellet, L., & Tremblay, Y. (1998). Elastic Recoil Detection Using Time-of-Flight for Analysis of Tin/Alsicu/Tin/Ti Contact Metallization Structures. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 138, 661-668. Lien externe

Leclerc, S., Lecours, A., Caron, M., Richard, E., Turcotte, G., & Currie, J. F. (1998). Electron Cyclotron Resonance Plasma Chemical Vapor Deposited Silicon Nitride for Micromechanical Applications. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 16(2), 881-884. Lien externe

1997

Caron, M., Akyel, C., & Ghannouchi, F. M. (janvier 1997). High power six-port network analyser [Communication écrite]. progress in electromagnetic research conference (PIER'97), Hong Kong. Non disponible

Drouin, D., Beauvais, J., Lemire, R., Lavallée, E., Gauvin, R., & Caron, M. (1997). Method for fabricating submicron silicide structures on silicon using a resistless electron beam lithography process. Applied Physics Letters, 70(22), 3020-3022. Lien externe

1996

Gagnon, G., Caron, M., Currie, J. F., Gujrathi, S. C., Fortin, V., Tremblay, Y., Oueller, L., Wang, M., Biberger, M., & Wong, F. (juin 1996). Effect of a TiN anti-reflecting coating on the performance of Ti/TiN/AlSiCu metallization of VLSI devices [Communication écrite]. 13th International VLSI Multilevel Interconnection (V-MIC) Conference, Santa Clara, CA, USA. Non disponible

Ouellet, O. L., Tremblay, Y., Gagnon, G., Caron, M., Currie, J. F., Gujrathi, S. C., Biberger, M., & Reynolds, R. (1996). The effect of an oxygen plasma exposure on the reliability of a ti/tin contact metallization. Journal of Applied Physics, 79(8, pt. 1), 4438-4443. Lien externe

Gagnon, G., Caron, M., Currie, J. F., Gujrathi, S. C., Fortin, V., Tremblay, Y., Ouellet, L., Wang, M., Biberger, M., & Wong, F. (juin 1996). Effect of the oxidation of TiN barrier on its efficiency as a diffusion barrier in AlSiCu metallization of VLSI devices [Communication écrite]. 13th International VLSI Multilevel Interconnection (V-MIC) Conference, Santa Clara, CA, USA. Non disponible

Gagnon, G., Gujrathi, S. C., Caron, M., Currie, J. F., Tremblay, Y., Ouellet, L., Biberger, M., & Reynolds, R. (1996). Effect of the oxidation of TiN on the stability of the Al/TiN interface. Journal of Applied Physics, 80(1), 188-195. Lien externe

Ouellet, L., Tremblay, Y., Gagnon, G., Caron, M., Currie, J. F., Gujrathi, S. C., & Biberger, M. (1996). The effect of the Ti glue layer in an integrated Ti/TiN/Ti/AlSiCu/TiN contact metallization process. Journal of vacuum science & technology. B. Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 2627-2635. Lien externe

Ouellet, L., Tremblay, Y., Gagnon, G., Caron, M., Currie, J. F., Gujrathi, S. C., & Biberger, M. (1996). Effect of the Ti/TiN bilayer barrier and its surface treatment on the reliability of a Ti/TiN/AlSiCu/TiN contact metallization. Journal of vacuum science & technology. B. Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 3502-3508. Lien externe

Caron, M., Gagnon, G., Gauvin, R., Hovington, P., Drouin, D., Currie, J. F., Tremblay, Y., Ouellet, L., Bigerger, M., & Wong, F. (juin 1996). An iterative procedure based on Monte Carlo simulation to determine the thickness and composition of VLSI metallization [Communication écrite]. 13th International VLSI Multilevel Interconnection (V-MIC) Conference, Santa Clara, CA, USA. Non disponible

Lecours, A., Caron, M., Ciureanu, P., Turcotte, G., Ivanov, D., Yelon, A., & Currie, J. F. (1996). Laser patterning of thin-film electrochemical gas sensors. Applied Surface Science, 96-98, 341-346. Lien externe

Lang, T., Caron, M., Izquierdo, R., Ivanov, D., Currie, J. F., & Yelon, A. (1996). Material characterization of sputtered sodium-ion conductive ceramics for a prototype CO₂ micro-sensor. Sensors and Actuators. B, Chemical, 31(1-2), 9-12. Lien externe

1995

Ivanov, D., Caron, M., Ouellet, I., Blain, A. S., Hendricks, A. N., & Currie, J. F. (1995). Structural and dielectric properties of spin-on barium-strontium titanate thin films. Journal of Applied Physics, 77(6), 2666-26671. Lien externe

Caron, M., Akyel, C., & Ghannouchi, F. M. (1995). Versatile easy to do six-port based high-power reflectometer. Journal of Microwave Power and Electromagnetic Energy, 30(4), 231-239. Lien externe

1994

Poiré, P., Caron, M., & Ghannouchi, F. M. (septembre 1994). A C-band double-balanced power amplifier [Communication écrite]. Canadian Conference on Electrical and Computer Engineering, Halifax, NS, Canada. Lien externe

Currie, J. F., Ivanov, D., Ciureanu, P., Lecours, A., Caron, M., Sacher, E., Turcotte, G., Yelon, A., & Lacroix, J. Nasicon thin film carbon dioxide sensor [Communication écrite]. Electrochemical Society Conference. Non disponible

Akyel, C., Ghannouchi, F. M., & Caron, M. (1994). New design for high-power six-port reflectometers using hybrid stripline/waveguide technology. IEEE Transactions on Instrumentation and Measurement, 43(2), 316-321. Lien externe

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