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Documents dont l'auteur est "Hoffmann, P."

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Nombre de documents: 12

C

Cicoira, F., Hoffmann, P., Olsson, C. O. A., Xanthopoulos, N., Mathieu, H. J., & Doppelt, P. (2005). Auger electron spectroscopy analysis of high metal content micro-structures grown by electron beam induced deposition. Applied Surface Science, 242(1-2), 107-113. Lien externe

Cicoira, F., Leifer, K., Hoffmann, P., Utke, I., Dwir, B., Laub, D., Buffat, P. A., Kapon, E., & Doppelt, P. (2004). Electron beam induced deposition of rhodium from the precursor [RhCl(PF3)2]2: Morphology, structure and chemical composition. Journal of Crystal Growth, 265(3-4), 619-626. Lien externe

D

Doridant, A., Raoult, J., Jarrix, S., Laurin, J.-J., & Hoffmann, P. (novembre 2015). Preliminary study of Automatic Control Gain loop subjected to pulse-modulated radiofrequency interference [Communication écrite]. 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2015), Edinburgh, Scotland. Lien externe

H

Hoffmann, P., Utke, I., & Cicoira, F. (juin 2002). Limits of 3-D nanostructures fabricated by focused electron beam (FEB) induced deposition [Communication écrite]. 10th International Symposium on Nanostructures: Physics and Technology, USA. Lien externe

Hoffmann, P., Utke, I., Jaenchen, G., Cicoira, F., & Rohner, J. (2002). Focused electron beam deposition of one-, two-, and three-dimensional nano-structures for biological applications. European Cells and Materials, 2(supp. 1), 91-92. Non disponible

Hoffmann, P., Utke, I., Cicoira, F., Dwir, B., Leifer, K., Kapon, E., & Doppelt, P. (avril 2000). Focused electron beam induced deposition of gold and rhodium [Communication écrite]. Materials Development for Direct Write Technologies (Symposium V), Warrendale, PA, USA. Lien externe

L

Luisier, A., Utke, I., Bret, T., Cicoira, F., Hauert, R., Rhee, S. W., Doppelt, P., & Hoffmann, P. (2005). Comparative study of cu-precursors for 3D focused electron beam induced deposition. Journal of The Electrochemical Society, 152(9), C590-C593. Lien externe

O

Ohta, T., Cicoira, F., Doppelt, P., Beitone, L., & Hoffmann, P. (2001). Self-reducible CuII source reagents for the CVD of copper. Chemical Vapor Deposition, 7(1), 28-31. Lien externe

Ohta, T., Cicoira, F., Doppelt, P., Beitone, L., & Hoffmann, P. (2001). Static vapor pressure measurement of low volatility precursors for molecular vapor deposition below ambient temperature. Chemical Vapor Deposition, 7(1), 33-37. Lien externe

S

Seuret, P., Cicoira, F., Ohta, T., Doppelt, P., Hoffmann, P., Weber, J., & Wesolowski, T. A. (2003). An experimental and theoretical study of [RhCl(PF3)2]2 fragmentation. Physical Chemistry Chemical Physics, 5(2), 268-274. Lien externe

U

Utke, I., Cicoira, F., Jaenchen, G., Hoffmann, P., Scandella, L., Dwir, B., Kapon, E., Laub, D., Buffat, P., Xanthopoulos, N., & Mathieu, H. J. (novembre 2001). Focused electron beam induced deposition of high resolution magnetic scanning probe tips [Communication écrite]. Making Functional Materials with Nanotubes (Symposium Z), Boston, MA, United states. Lien externe

Utke, I., Dwir, B., Leifer, K., Cicoira, F., Doppelt, P., Hoffmann, P., & Kapon, E. (septembre 1999). Electron beam induced deposition of metallic tips and wires for microelectronics applications [Communication écrite]. 25th International Conference on Micro- and Nano-Engineering. Publié dans Microelectronic Engineering, 53(1-4). Lien externe

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