I. Utke, Fabio Cicoira, G. Jaenchen, P. Hoffmann, L. Scandella, B. Dwir, E. Kapon, D. Laub, Ph Buffat, N. Xanthopoulos and H. J. Mathieu
Paper (2001)
Document published while its authors were not affiliated with Polytechnique Montréal
An external link is available for this itemPolyPublie URL: | https://publications.polymtl.ca/26215/ |
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Conference Title: | Making Functional Materials with Nanotubes (Symposium Z) |
Conference Location: | Boston, MA, United states |
Conference Date(s): | 2001-11-26 - 2001-11-29 |
Publisher: | Materials Research Society |
DOI: | 10.1557/proc-706-z9.24.1 |
Official URL: | https://doi.org/10.1557/proc-706-z9.24.1 |
Date Deposited: | 18 Apr 2023 15:21 |
Last Modified: | 25 Sep 2024 16:06 |
Cite in APA 7: | Utke, I., Cicoira, F., Jaenchen, G., Hoffmann, P., Scandella, L., Dwir, B., Kapon, E., Laub, D., Buffat, P., Xanthopoulos, N., & Mathieu, H. J. (2001, November). Focused electron beam induced deposition of high resolution magnetic scanning probe tips [Paper]. Making Functional Materials with Nanotubes (Symposium Z), Boston, MA, United states. https://doi.org/10.1557/proc-706-z9.24.1 |
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