Auger electron spectroscopy analysis of high metal content micro-structures grown by electron beam induced deposition

Fabio Cicoira, P. Hoffmann, C. O. A. Olsson, N. Xanthopoulos, H. J. Mathieu and P. Doppelt

Article (2005)

Document published while its authors were not affiliated with Polytechnique Montréal

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PolyPublie URL:	https://publications.polymtl.ca/24267/
Journal Title:	Applied Surface Science (vol. 242, no. 1-2)
Publisher:	Elsevier
DOI:	10.1016/j.apsusc.2004.08.005
Official URL:	https://doi.org/10.1016/j.apsusc.2004.08.005
Date Deposited:	18 Apr 2023 15:18
Last Modified:	25 Sep 2024 16:04

Cite in APA 7:	Cicoira, F., Hoffmann, P., Olsson, C. O. A., Xanthopoulos, N., Mathieu, H. J., & Doppelt, P. (2005). Auger electron spectroscopy analysis of high metal content micro-structures grown by electron beam induced deposition. Applied Surface Science, 242(1-2), 107-113. https://doi.org/10.1016/j.apsusc.2004.08.005
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