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Decorse, P., Quenneville, E., Poulin, S., Meunier, M., Yelon, A., & Morin, F. (2001). Chemical and structural characterization of La₀.₅Sr₀.₅MnO₃ thin films prepared by pulsed-laser deposition. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 19(3), 910-915. Lien externe
Gagnon, Y., Meunier, M., & Savaria, Y. (2001). Method and apparatus for iteratively, selectively tuning the impedance of integrated semiconductor devices using a focussed heating source. (Brevet no US6329272). Lien externe
Kabashin, A. V., Meunier, M., & Leonelli, R. (2001). Photoluminescence Characterization of Si-Based Nanostructured Films Produced by Pulsed Laser Ablation. Journal of Vacuum Science & Technology B: Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 19(6), 2217-2222. Lien externe
Lorazo, P., Lewis, L. J., & Meunier, M. (janvier 2001). Simulation of picosecond pulsed laser ablation of silicon: The molecular-dynamics thermal-annealing model [Communication écrite]. Commercial and Biomedical Applications of Ultrashort Pulse Lasers; Laser Plasma Generation and Diagnostics, San Jose, CA, United States. Lien externe
Meunier, M., Gagnon, Y., Savaria, Y., Lacourse, A., & Cadotte, M. A novel laser trimming technique for microelectronics [Communication écrite]. 6th Conference on Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM 2001). Lien externe
Popovici, D., & Meunier, M. (2001). Focusing Method and Apparatus for High-Resolution Projection Patterning. Review of Scientific Instruments, 72(2), 1435-1437. Lien externe
Quenneville, E., Meunier, M., Yelon, A., & Morin, F. (2001). Electronic Transport by Small Polarons in La₀.₅ Sr₀.₅ MnO₃. Journal of Applied Physics, 90(4), 1891-1897. Lien externe
Wu, X., Sacher, E., & Meunier, M. (2001). Thermophoretic Control of Submicron-Sized Particulate Recontamination. Journal of Adhesion, 75(3), 341-350. Lien externe
Yang, D. Q., Meunier, M., & Sacher, E. (2001). The Estimation of the Average Dimensions of Deposited Clusters From XPS Emission Intensity Ratios. Applied Surface Science, 173(1-2), 134-139. Lien externe
