De Quan Yang, Michel Meunier and Edward Sacher
Article (2001)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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Department: | Department of Engineering Physics |
Research Center: | GCM - Thin Film Physics and Technology Research Group |
PolyPublie URL: | https://publications.polymtl.ca/26939/ |
Journal Title: | Applied Surface Science (vol. 173, no. 1-2) |
Publisher: | Elsevier |
DOI: | 10.1016/s0169-4332(00)00895-3 |
Official URL: | https://doi.org/10.1016/s0169-4332%2800%2900895-3 |
Date Deposited: | 18 Apr 2023 15:21 |
Last Modified: | 25 Sep 2024 16:07 |
Cite in APA 7: | Yang, D. Q., Meunier, M., & Sacher, E. (2001). The Estimation of the Average Dimensions of Deposited Clusters From XPS Emission Intensity Ratios. Applied Surface Science, 173(1-2), 134-139. https://doi.org/10.1016/s0169-4332%2800%2900895-3 |
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