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Documents dont l'auteur est "Petrov, I."

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Nombre de documents: 13

Article de revue

Gall, D., Städele, M., Jarrendahl, K., Petrov, I., Desjardins, P., Haasch, R. T., Lee, T.-Y., & Greene, J. E. (2001). Electronic structure of ScN determined using optical spectroscopy, photoemission, andabinitio calculations. Physical review, 63(12). Lien externe

Shin, C.-S., Gall, D., Kim, Y.-W., Desjardins, P., Petrov, I., Greene, J. E., Odén, M., & Hultman, L. (2001). Epitaxial NaCl-structure delta-TaNx(001): electronic transport properties, elastic modulus, and hardness vs. N/Ta ratio. Journal of Applied Physics, 90(6), 2879-2895. Lien externe

Chun, J. S., Desjardins, P., Lavoie, C., Petrov, I., Cabral, C., & Greene, J. E. (2001). Interfacial Reaction Pathways and Kinetics During Annealing of 111-Textured Al-Tin Bilayers: a Synchrotron X-Ray Diffraction and Transmission Electron Microscopy Study. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 19(5), 2207-2216. Lien externe

Chun, J.-S., Desjardins, P., Petrov, I., Greene, J. E., Lavoie, C., & Cabral, C. J. (2001). Interfacial reaction pathways and kinetics during annealing of epitaxial Al(001)/TiN(001) model diffusion barrier systems. Thin Solid Films, 391(1), 69-80. Lien externe

Chun, J. S., Desjardins, P., Lavoie, C., Shin, C. S., Cabral, C., Petrov, I., & Greene, J. E. (2001). Interfacial Reactions in Epitaxial Al/Tin(111) Model Diffusion Barriers: Formation of an Impervious Self-Limited Wurtzite- Structure Aln(0001) Blocking Layer. Journal of Applied Physics, 89(12), 7841-7845. Lien externe

D'Arcy-Gall, J., Gall, D., Petrov, I., Desjardins, P., & Greene, J. E. (2001). Quantitative C lattice site distributions in epitaxial Ge1-yCy/Ge(001) layers. Journal of Applied Physics, 90(8), 3910-3918. Lien externe

Chun, J.-S., Carlsson, J. R. A., Desjardins, P., Bergstrom, D. B., Petrov, I., Greene, J. E., Lavoie, C., & Cabral, C. (2001). Synchrotron x-ray diffraction and transmission electon microscopy studies of interfacial reaction paths and kinetics annealing of fully-002-textured Al/TiN bilayers. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 19(1), 182-191. Lien externe

Kodambaka, S., Petrova, V., Vailionis, A., Desjardins, P., Cahill, D. G., Petrov, I., & Greene, J. E. (2001). TiN(001) and TiN(111) island coarsening kinetics: In-situ scanning tunneling microscopy studies. Thin Solid Films, 392(2), 164-168. Lien externe

D'arcy Gall, J., Desjardins, P., Petrov, I., Greene, J. E., Paultre, J. E., Masut, R. A., Gujrathi, S. C., & Roorda, S. (2000). Epitaxial metastable Ge₁₋y Cy (y≤0.02) alloys grown on Ge(001) from hyperthermal beams: C incorporation and lattice sites. Journal of Applied Physics, 88(1), 96-104. Lien externe

Kodambaka, S., Petrova, V., Vailionis, P., Desjardins, P., Cahill, D. G., Petrov, I., & Greene, J. E. (2000). In-situ high-temperature scanning tunneling microscopy studies of two-dimensional island decay kinetics on atomically flat smooth TiN(001). Surface Review and Letters, 7(05n06), 589-593. Lien externe

D'Arcy-Gall, J., Gall, D., Desjardins, P., & Petrov, I. (2000). Role of fast sputtered particles during sputter deposition: growth of epitaxial Ge0.99C0.01/Ge(001). Physical review. B, Condensed matter, 62(16), 11203-11208. Lien externe

Gujrathi, S. C., Roorda, S., D'Arcy, J. G., Pflueger, R. L., Desjardins, P., Petrov, I., & Greene, J. E. (1998). Quantitative compositional depth profiling of Si₁₋ₓ₋yGeₓCy thin films by simultaneous elastic recoil detection and Rutherford backscattering spectrometry. Nuclear Instruments & Methods in Physics Research. Section B, Beam Interactions With Materials and Atoms, 136-138, 654-660. Lien externe

Karr, B. W., Petrov, I., Desjardins, P., Cahill, D. G., & Greene, J. E. (1997). In situ scanning tunneling microscopy studies of the evolution of surface morphology ans microstructure in epitaxial TiN(001) grown by ultra-high-vacuum reactive magnetron sputtering. Surface and Coatings Technology, 94-95, 403-408. Lien externe

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