Interfacial Reaction Pathways and Kinetics During Annealing of 111-Textured Al-Tin Bilayers: a Synchrotron X-Ray Diffraction and Transmission Electron Microscopy Study

J. S. Chun, Patrick Desjardins, C. Lavoie, I. Petrov, C. Cabral and J. E. Greene

Article (2001)

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Additional Information:	Nom historique du département: Département de génie physique et de génie des matériaux
Department:	Department of Engineering Physics
PolyPublie URL:	https://publications.polymtl.ca/27505/
Journal Title:	Journal of vacuum science and technology. A, Vacuum, surfaces, and films (vol. 19, no. 5)
Publisher:	American Vacuum Society
DOI:	10.1116/1.1379800
Official URL:	https://doi.org/10.1116/1.1379800
Date Deposited:	18 Apr 2023 15:21
Last Modified:	08 Apr 2025 02:17

Cite in APA 7:	Chun, J. S., Desjardins, P., Lavoie, C., Petrov, I., Cabral, C., & Greene, J. E. (2001). Interfacial Reaction Pathways and Kinetics During Annealing of 111-Textured Al-Tin Bilayers: a Synchrotron X-Ray Diffraction and Transmission Electron Microscopy Study. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 19(5), 2207-2216. https://doi.org/10.1116/1.1379800
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