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Items where Author is "Cabral, C."

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C

Chun, J. S., Desjardins, P., Lavoie, C., Petrov, I., Cabral, C., & Greene, J. E. (2001). Interfacial Reaction Pathways and Kinetics During Annealing of 111-Textured Al-Tin Bilayers: a Synchrotron X-Ray Diffraction and Transmission Electron Microscopy Study. Journal of vacuum science and technology. A, Vacuum, surfaces, and films, 19(5), 2207-2216. External link

Chun, J. S., Desjardins, P., Lavoie, C., Shin, C. S., Cabral, C., Petrov, I., & Greene, J. E. (2001). Interfacial Reactions in Epitaxial Al/Tin(111) Model Diffusion Barriers: Formation of an Impervious Self-Limited Wurtzite- Structure Aln(0001) Blocking Layer. Journal of Applied Physics, 89(12), 7841-7845. External link

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Lavoie, C., Coia, C., D'heurle, F. M., Detavernier, C., Cabral, C., Desjardins, P., & Kellock, A. J. (2004, July). Reactive Diffusion in the Ni-Si System: Phase Sequence and Formation of Metal-Rich Phases [Paper]. Diffusion in Materials: Dimat 2004 : 6th International Conference on Diffusion in Materials, Cracow, Poland. External link

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Özcan, A. S., Ludwig, K., Lavoie, C., Basu, S. N., Coia, C., Cabral, C., Rodbell, K. P., & E. Harper, J. M. (2004). Evolution of microstructure in Ti–Ta bilayer thin films on polycrystalline-Si and Si(001). Thin Solid Films, 466(1-2), 238-249. External link

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