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In the context of this page, the word cloud was generated from the publications of the author {}. The words in this cloud come from the titles, abstracts, and keywords of the author's articles and research papers. By analyzing this word cloud, you can get an overview of the most recurring and significant topics and research areas in the author's work.
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Boulais, É., Binet, V., Degorce, J.-Y., Wild, G., Savaria, Y., & Meunier, M. (2008). Thermodynamics and Transport Model of Charge Injection in Silicon Irradiated by a Pulsed Focused Laser. IEEE Transactions on Electron Devices, 55(10), 2728-2735. External link
Besner, S., Degorce, J.-Y., Kabashin, A., & Meunier, M. (2004, May). Influence of ambient medium on femtosecond laser processing of silicon [Paper]. European Materials Research Society 2004 - Symposium N, Strasbourg, France. Published in Applied Surface Science, 247(1-4). External link
Besner, S., Degorce, J.-Y., Kabashin, A., & Meunier, M. Surface Modifications During Femtosecond Laser Ablation in Vacuum, Air and Water [Paper]. Photonics North 2004, Ottawa, Ontario, Canada. External link
Degorce, J.-Y., Gillet, J.-N., Magny, F., & Meunier, M. (2005). Three-Dimensional Transient Temperature Field Model for Laser Annealing. Journal of Applied Physics, 97(3), 033520-1-033520-6. External link
Degorce, J.-Y., Gillet, J.-N., Magny, F., & Meunier, M. (2004, March). Three-dimensional dynamic modeling of the solid-liquid interface formed by a pulsed focused laser beam on a SiO2/Si bilayers substrate [Paper]. APS March Meeting, Montréal, Québec. Unavailable
Degorce, J.-Y., Saucier, A., & Meunier, M. (2002, June). A simple analytical method for the characterization of the melt region of a semiconductor under focused laser irradiation [Paper]. European Materials Research Society conference on Physics and Chemistry of Advanced Laser Materials Processing, Strasbourg, France. Published in Applied Surface Science, 208-209. External link
Gillet, J.-N., Degorce, J.-Y., & Meunier, M. (2009). Modeling of Three-Dimensional Diffusible Resistors With the One-Dimensional Tube Multiplexing Method. Semiconductor Science and Technology, 24(9), 11 pages. External link
Gillet, J.-N., Degorce, J.-Y., & Meunier, M. (2005). General Model and Segregation Coefficient Measurement for Ultrashallow Doping by Excimer Laser Annealing. Applied Physics Letters, 86(22). External link
Gillet, J.-N., Degorce, J.-Y., Liao, Y., & Meunier, M. (2004, March). Real-time modeling of modeling of ultra-shallow doping by laser annealing for next-generation CMOS [Paper]. APS March Meeting, Montréal, Québec. Unavailable
Liao, Y., Degorce, J.-Y., & Meunier, M. (2006). Laser induced formation of periodic nanostructures in silicon covered by SiO₂. Applied Physics. A, Materials Science & Processing, A82(4), 679-682. External link
Meunier, M., Degorce, J.-Y., Gillet, J.-N., & Magny, F. (2004, January). Modeling the laser-induced diffusible resistance process [Paper]. Photon processing in microelectronics and photonics III, San Jose, CA, USA. External link
Meunier, M., Ducharme, M., Degorce, J.-Y., Liao, Y., & Lacourse, A. (2002, September). Laser Induced Local Modification of Silicon Microdevices: a New Technique for Tuning Analogue Microelectronics [Paper]. International Conference on Advanced Laser Technologies (ALT 2002), Adelboden, Switzerland. External link
Saucier, A., Degorce, J.-Y., & Meunier, M. (2004). Analytical Solutions of a Growth Model for a Melt Region Induced by a Focused Laser Beam. SIAM Journal on Applied Mathematics, 64(6), 2076-2095. External link