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A simple analytical method for the characterization of the melt region of a semiconductor under focused laser irradiation

Jean-Yves Degorce, Antoine Saucier and Michel Meunier

Paper (2002)

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Department: Department of Engineering Physics
Department of Mathematics and Industrial Engineering
PolyPublie URL: https://publications.polymtl.ca/25971/
Conference Title: European Materials Research Society conference on Physics and Chemistry of Advanced Laser Materials Processing
Conference Location: Strasbourg, France
Conference Date(s): 2002-06-18 - 2002-06-21
Journal Title: Applied Surface Science (vol. 208-209)
Publisher: Elsevier
DOI: 10.1016/s0169-4332(02)01350-8
Official URL: https://doi.org/10.1016/s0169-4332%2802%2901350-8
Date Deposited: 18 Apr 2023 15:19
Last Modified: 05 Apr 2024 11:12
Cite in APA 7: Degorce, J.-Y., Saucier, A., & Meunier, M. (2002, June). A simple analytical method for the characterization of the melt region of a semiconductor under focused laser irradiation [Paper]. European Materials Research Society conference on Physics and Chemistry of Advanced Laser Materials Processing, Strasbourg, France. Published in Applied Surface Science, 208-209. https://doi.org/10.1016/s0169-4332%2802%2901350-8

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