Jean-Yves Degorce, Antoine Saucier
and Michel Meunier
Paper (2002)
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| Department: |
Department of Engineering Physics Department of Mathematics and Industrial Engineering |
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| PolyPublie URL: | https://publications.polymtl.ca/25971/ |
| Conference Title: | European Materials Research Society conference on Physics and Chemistry of Advanced Laser Materials Processing |
| Conference Location: | Strasbourg, France |
| Conference Date(s): | 2002-06-18 - 2002-06-21 |
| Journal Title: | Applied Surface Science (vol. 208-209) |
| Publisher: | Elsevier |
| DOI: | 10.1016/s0169-4332(02)01350-8 |
| Official URL: | https://doi.org/10.1016/s0169-4332%2802%2901350-8 |
| Date Deposited: | 18 Apr 2023 15:19 |
| Last Modified: | 25 Sep 2024 16:06 |
| Cite in APA 7: | Degorce, J.-Y., Saucier, A., & Meunier, M. (2002, June). A simple analytical method for the characterization of the melt region of a semiconductor under focused laser irradiation [Paper]. European Materials Research Society conference on Physics and Chemistry of Advanced Laser Materials Processing, Strasbourg, France. Published in Applied Surface Science, 208-209. https://doi.org/10.1016/s0169-4332%2802%2901350-8 |
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