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Items where Author is "Ayari, Bechir"

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Number of items: 6.

Article

Ayari, B., & Kaminska, B. (1994). New dynamic test vector compaction for automatic test pattern generation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 13(3), 353-358. External link

Paper

Ben-Hamida, N., Ayari, B., & Kaminska, B. (1996, October). Testing of embedded A/D converters in mixed-signal circuit [Paper]. 1996 International Conference on Computer Design, ICCD'96, Austin, TX, USA. External link

Lejmi, S., Kaminska, B., & Ayari, B. (1995, April). Retiming for BIST-sequential circuits [Paper]. 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95, Seattle, WA, USA. External link

Lejmi, S., Kaminska, B., & Ayari, B. (1995, April). Retiming, resynthesis, and partitioning for the pseudo-exhaustive testing of sequential circuits [Paper]. 13th IEEE VLSI Test Symposium, Princeton, NJ, USA. External link

Lejmi, S., Kaminska, B., & Ayari, B. (1995, October). Synthesis and retiming for the pseudo-exhaustive BIST of synchronous sequential circuits [Paper]. 1995 26th International Test Conference, Washington, DC, USA. External link

Ph.D. thesis

Ayari, B. (1996). Génération de vecteurs de test pour les circuits combinatoires, séquentiels et mixtes basée sur le OBDD [Ph.D. thesis, École Polytechnique de Montréal]. Available

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