Bechir Ayari and Bożena Kamińska
Article (1995)
An external link is available for this item| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/32591/ |
| Journal Title: | IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing (vol. 42, no. 7) |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/82.401167 |
| Official URL: | https://doi.org/10.1109/82.401167 |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 15 Apr 2026 15:49 |
| Cite in APA 7: | Ayari, B., & Kamińska, B. (1995). CYCLOGEN: Automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 42(7), 446-452. https://doi.org/10.1109/82.401167 |
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