CYCLOGEN: Automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation

Ayari Bechir and Bozena Kaminska

Article (1995)

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Additional Information:	Nom historique du département: Département de génie électrique et de génie informatique
Department:	Department of Electrical Engineering Department of Computer Engineering and Software Engineering
PolyPublie URL:	https://publications.polymtl.ca/32591/
Journal Title:	IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing (vol. 42, no. 7)
Publisher:	IEEE
DOI:	10.1109/82.401167
Official URL:	https://doi.org/10.1109/82.401167
Date Deposited:	18 Apr 2023 15:24
Last Modified:	08 Apr 2025 06:53

Cite in APA 7:	Bechir, A., & Kaminska, B. (1995). CYCLOGEN: Automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 42(7), 446-452. https://doi.org/10.1109/82.401167
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