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CYCLOGEN: Automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation

Ayari Bechir and Bozena Kaminska

Article (1995)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32591/
Journal Title: IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing (vol. 42, no. 7)
Publisher: IEEE
DOI: 10.1109/82.401167
Official URL: https://doi.org/10.1109/82.401167
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Bechir, A., & Kaminska, B. (1995). CYCLOGEN: Automatic, functional-level test generator based on the cyclomatic complexity measure and on the ROBDD representation. IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 42(7), 446-452. https://doi.org/10.1109/82.401167

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