Ayari Bechir and Bozena Kaminska
Paper (1995)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/32592/ |
| Conference Title: | 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95 |
| Conference Location: | Seattle, WA, USA |
| Conference Date(s): | 1995-04-30 - 1995-05-03 |
| Publisher: | IEEE |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 25 Sep 2024 16:15 |
| Cite in APA 7: | Bechir, A., & Kaminska, B. (1995, April). BDD_FTEST: fast, backtrack-free test generator based on binary decision diagram representation [Paper]. 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95, Seattle, WA, USA. |
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