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BDD_FTEST: fast, backtrack-free test generator based on binary decision diagram representation

Ayari Bechir and Bozena Kaminska

Paper (1995)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/32592/
Conference Title: 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95
Conference Location: Seattle, WA, USA
Conference Date(s): 1995-04-30 - 1995-05-03
Publisher: IEEE
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:23
Cite in APA 7: Bechir, A., & Kaminska, B. (1995, April). BDD_FTEST: fast, backtrack-free test generator based on binary decision diagram representation [Paper]. 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95, Seattle, WA, USA.

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