Samir Lejmi, Bozena Kaminska and Bechir Ayari
Paper (1995)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
PolyPublie URL: | https://publications.polymtl.ca/31998/ |
Conference Title: | 13th IEEE VLSI Test Symposium |
Conference Location: | Princeton, NJ, USA |
Conference Date(s): | 1995-04-30 - 1995-05-03 |
Publisher: | IEEE |
DOI: | 10.1109/vtest.1995.512671 |
Official URL: | https://doi.org/10.1109/vtest.1995.512671 |
Date Deposited: | 18 Apr 2023 15:25 |
Last Modified: | 25 Sep 2024 16:14 |
Cite in APA 7: | Lejmi, S., Kaminska, B., & Ayari, B. (1995, April). Retiming, resynthesis, and partitioning for the pseudo-exhaustive testing of sequential circuits [Paper]. 13th IEEE VLSI Test Symposium, Princeton, NJ, USA. https://doi.org/10.1109/vtest.1995.512671 |
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