<  Back to the Polytechnique Montréal portal

New dynamic test vector compaction for automatic test pattern generation

Bechir Ayari and Bozena Kaminska

Article (1994)

An external link is available for this item
Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/33586/
Journal Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (vol. 13, no. 3)
Publisher: IEEE
DOI: 10.1109/43.265676
Official URL: https://doi.org/10.1109/43.265676
Date Deposited: 18 Apr 2023 15:25
Last Modified: 05 Apr 2024 11:24
Cite in APA 7: Ayari, B., & Kaminska, B. (1994). New dynamic test vector compaction for automatic test pattern generation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 13(3), 353-358. https://doi.org/10.1109/43.265676

Statistics

Dimensions

Repository Staff Only

View Item View Item