Bechir Ayari and Bozena Kaminska
Article (1994)
An external link is available for this item
| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/33586/ |
| Journal Title: | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (vol. 13, no. 3) |
| Publisher: | IEEE |
| DOI: | 10.1109/43.265676 |
| Official URL: | https://doi.org/10.1109/43.265676 |
| Date Deposited: | 18 Apr 2023 15:25 |
| Last Modified: | 25 Sep 2024 16:16 |
| Cite in APA 7: | Ayari, B., & Kaminska, B. (1994). New dynamic test vector compaction for automatic test pattern generation. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 13(3), 353-358. https://doi.org/10.1109/43.265676 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
