Documents publiés en "2001"

D

Di Renzo, M., Ellis, T. H., Sacher, E., & Stangel, I. (2001). A Photoacoustic Ftirs Study of the Chemical Modifications of Human Dentin Surfaces: I. Demineralization. Biomaterials, 22(8), 787-792. Lien externe

Di Renzo, M., Ellis, T. H., Sacher, E., & Stangel, I. (2001). A Photoacoustic Ftirs Study of the Chemical Modifications of Human Dentin Surfaces: II. Deproteination. Biomaterials, 22(8), 793-797. Lien externe

E

El Feninat, F., Ellis, T. H., Sacher, E., & Stangel, I. (2001). A Tapping Mode Afm Study of Collapse and Denaturation in Dentinal Collagen. Dental Materials, 17(4), 284-288. Lien externe

El Feninat, F., Elouatik, S., Ellis, T. H., Sacher, E., & Stangel, I. (2001). Quantitative Assessment of Surface Roughness as Measured by AFM: Application to Polished Human Dentin. Applied Surface Science, 183(3-4), 205-215. Lien externe

S

Sadough-Vanini, A., Yang, D. Q., Martinu, L., & Sacher, E. (2001). The Adhesion of Evaporated Copper to Dow Cyclotene 3022 (R), Determined by Microscratch Testing. Journal of Adhesion, 77(4), 309-321. Lien externe

Sandrin, L., Silverstein, M. S., & Sacher, E. (2001). Fluorine incorporation in plasma-polymerised octofluorocyclobutane, hexafluoropropylene and trifluoroethylene. Polymer, 42(8), 3761-3769. Lien externe

Sheng, S. R., Sacher, E., & Yelon, A. (2001). Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect? Journal of Non-Crystalline Solids, 282(2-3), 165-172. Lien externe

Sheng, S., Sacher, E., & Yelon, A. (avril 2000). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Communication écrite]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. Lien externe

Silverstein, M. S., Sandrin, L., & Sacher, E. (2001). The Copper/Plasma-Polymerized Octofluorocyclobutane Interface. Polymer, 42(9), 4299-4307. Lien externe

W

Wu, X., Sacher, E., & Meunier, M. (2001). Thermophoretic Control of Submicron-Sized Particulate Recontamination. Journal of Adhesion, 75(3), 341-350. Lien externe

Y

Yang, D. Q., & Sacher, E. (2001). Argon Ion Treatment of the Dow Cyclotene 3022 Surface and Its Effect on the Adhesion of Evaporated Copper. Applied Surface Science, 173(1-2), 30-40. Lien externe

Yang, D. Q., & Sacher, E. (2001). Coalescence Kinetics of Copper Clusters on Highly Oriented Pyrolytic Graphite and Dow Cyclotene, as Determined by X-Ray Photoelectron Spectroscopy. Journal of Applied Physics, 90(9), 4768-4771. Lien externe

Yang, D. Q., Meunier, M., & Sacher, E. (2001). The Estimation of the Average Dimensions of Deposited Clusters From XPS Emission Intensity Ratios. Applied Surface Science, 173(1-2), 134-139. Lien externe

Yang, D. Q., Sacher, E., Griswold, E. M., & Smith, G. (2001). The Enhancement of the Adhesion of Copper Layers to Dow Cyclotene 3022 Through Metal Sputtering. Applied Surface Science, 180(3-4), 200-208. Lien externe