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Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect?

S. R. Sheng, Edward Sacher and Arthur Yelon

Article (2001)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/27041/
Journal Title: Journal of Non-Crystalline Solids (vol. 282, no. 2-3)
Publisher: Elsevier
DOI: 10.1016/s0022-3093(01)00339-8
Official URL: https://doi.org/10.1016/s0022-3093%2801%2900339-8
Date Deposited: 18 Apr 2023 15:21
Last Modified: 05 Apr 2024 11:14
Cite in APA 7: Sheng, S. R., Sacher, E., & Yelon, A. (2001). Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect? Journal of Non-Crystalline Solids, 282(2-3), 165-172. https://doi.org/10.1016/s0022-3093%2801%2900339-8

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