Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect?

Shuran Sheng, Edward Sacher and Arthur Yelon

Article (2001)

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Additional Information:	Nom historique du département: Département de génie physique et de génie des matériaux
Department:	Department of Engineering Physics
Research Center:	GCM - Thin Film Physics and Technology Research Group
PolyPublie URL:	https://publications.polymtl.ca/27041/
Journal Title:	Journal of Non-Crystalline Solids (vol. 282, no. 2-3)
Publisher:	Elsevier
DOI:	10.1016/s0022-3093(01)00339-8
Official URL:	https://doi.org/10.1016/s0022-3093%2801%2900339-8
Date Deposited:	18 Apr 2023 15:21
Last Modified:	08 Apr 2025 02:16

Cite in APA 7:	Sheng, S., Sacher, E., & Yelon, A. (2001). Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect? Journal of Non-Crystalline Solids, 282(2-3), 165-172. https://doi.org/10.1016/s0022-3093%2801%2900339-8
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