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Sheng, S., Sacher, E., & Yelon, A. (2001). Structural Changes in Amorphous Silicon Studied by X-Ray Photoemission Spectroscopy: a Phenomenon Independent of the Staebler-Wronski Effect? Journal of Non-Crystalline Solids, 282(2-3), 165-172. External link
Sheng, S., Sacher, E., & Yelon, A. (2000, April). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Paper]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. External link
Sheng, S., Sacher, E., Yelon, A., Branz, H. M., & Masson, D. P. (1999, April). Structural changes in a-Si:H studied by X-ray photoemission spectroscopy [Paper]. 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices', San Francisco, CA. Published in Materials Research Society Symposium - Proceedings, 557. External link