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Structural changes in a-Si:H studied by X-ray photoemission spectroscopy

Shuran Sheng, Edward Sacher, Arthur Yelon, Howard M. Branz and Denis P. Masson

Paper (1999)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/28598/
Conference Title: 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices'
Conference Location: San Francisco, CA
Conference Date(s): 1999-01-01 - 1999-12-31
Journal Title: Materials Research Society Symposium - Proceedings (vol. 557)
Publisher: Materials Research Society
DOI: 10.1557/proc-557-359
Official URL: https://doi.org/10.1557/proc-557-359
Date Deposited: 18 Apr 2023 15:22
Last Modified: 05 Apr 2024 11:16
Cite in APA 7: Sheng, S., Sacher, E., Yelon, A., Branz, H. M., & Masson, D. P. (1999, January). Structural changes in a-Si:H studied by X-ray photoemission spectroscopy [Paper]. 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices', San Francisco, CA. Published in Materials Research Society Symposium - Proceedings, 557. https://doi.org/10.1557/proc-557-359

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