Shuran Sheng, Edward Sacher, Arthur Yelon
, Howard M. Branz and Denis P. Masson
Paper (1999)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
|---|---|
| Department: | Department of Engineering Physics |
| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/28598/ |
| Conference Title: | 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices' |
| Conference Location: | San Francisco, CA |
| Conference Date(s): | 1999-04-05 - 1999-04-09 |
| Journal Title: | Materials Research Society Symposium - Proceedings (vol. 557) |
| Publisher: | Materials Research Society |
| DOI: | 10.1557/proc-557-359 |
| Official URL: | https://doi.org/10.1557/proc-557-359 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 08 Apr 2025 02:18 |
| Cite in APA 7: | Sheng, S., Sacher, E., Yelon, A., Branz, H. M., & Masson, D. P. (1999, April). Structural changes in a-Si:H studied by X-ray photoemission spectroscopy [Paper]. 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices', San Francisco, CA. Published in Materials Research Society Symposium - Proceedings, 557. https://doi.org/10.1557/proc-557-359 |
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