Shuran Sheng, Edward Sacher, Arthur Yelon, Howard M. Branz and Denis P. Masson
Paper (1999)
An external link is available for this itemAdditional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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Department: | Department of Engineering Physics |
Research Center: | GCM - Thin Film Physics and Technology Research Group |
PolyPublie URL: | https://publications.polymtl.ca/28598/ |
Conference Title: | 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices' |
Conference Location: | San Francisco, CA |
Conference Date(s): | 1999-04-05 - 1999-04-09 |
Journal Title: | Materials Research Society Symposium - Proceedings (vol. 557) |
Publisher: | Materials Research Society |
DOI: | 10.1557/proc-557-359 |
Official URL: | https://doi.org/10.1557/proc-557-359 |
Date Deposited: | 18 Apr 2023 15:22 |
Last Modified: | 25 Sep 2024 16:09 |
Cite in APA 7: | Sheng, S., Sacher, E., Yelon, A., Branz, H. M., & Masson, D. P. (1999, April). Structural changes in a-Si:H studied by X-ray photoemission spectroscopy [Paper]. 1999 MRS Spring Meeting - Symposium A 'Amorphous and Heterogenous Silicon Thin Films: Fundamentals to Devices', San Francisco, CA. Published in Materials Research Society Symposium - Proceedings, 557. https://doi.org/10.1557/proc-557-359 |
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