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X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon

S. Sheng, Edward Sacher and Arthur Yelon

Paper (2000)

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Additional Information: Nom historique du département: Département de génie physique et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/27042/
Conference Title: Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium
Conference Location: San Francisco, CA, USA
Conference Date(s): 2000-04-24 - 2000-04-28
Publisher: Materials Research Society
DOI: 10.1557/proc-609-a10.1
Official URL: https://doi.org/10.1557/proc-609-a10.1
Date Deposited: 18 Apr 2023 15:21
Last Modified: 05 Apr 2024 11:14
Cite in APA 7: Sheng, S., Sacher, E., & Yelon, A. (2000, April). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Paper]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. https://doi.org/10.1557/proc-609-a10.1

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