Shuran Sheng, Edward Sacher and Arthur Yelon
Paper (2000)
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| Additional Information: | Nom historique du département: Département de génie physique et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| Research Center: | GCM - Thin Film Physics and Technology Research Group |
| PolyPublie URL: | https://publications.polymtl.ca/27042/ |
| Conference Title: | Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium |
| Conference Location: | San Francisco, CA, USA |
| Conference Date(s): | 2000-04-24 - 2000-04-28 |
| Publisher: | Materials Research Society |
| DOI: | 10.1557/proc-609-a10.1 |
| Official URL: | https://doi.org/10.1557/proc-609-a10.1 |
| Date Deposited: | 18 Apr 2023 15:21 |
| Last Modified: | 25 Sep 2024 16:07 |
| Cite in APA 7: | Sheng, S., Sacher, E., & Yelon, A. (2000, April). X-ray photoemission spectroscopic study of light-induced structural changes in amorphous silicon [Paper]. Amorphous and Heterogeneous Silicon Thin Films - 2000. Symposium, San Francisco, CA, USA. https://doi.org/10.1557/proc-609-a10.1 |
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