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Ammar, M., Hamad, G. B., Mohamed, O. A., & Savaria, Y. (septembre 2016). Efficient probabilistic fault tree analysis of safety critical systems via probabilistic model checking [Communication écrite]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (8 pages). Lien externe
Hamad, G. B., Kazma, G., Mohamed, O. A., & Savaria, Y. (juillet 2017). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Communication écrite]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. Lien externe
Hamad, G. B., Kazma, G., Mohamed, O. A., & Savaria, Y. (septembre 2016). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Communication écrite]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). Lien externe
Hamad, G. B., Mohamed, O. A., & Savaria, Y. (mai 2016). Towards formal abstraction, modeling, and analysis of single event transients at RTL [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2016), Montréal, Québec. Lien externe
Hamad, G. B., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (2015). Characterizing, modeling, and analyzing soft error propagation in asynchronous and synchronous digital circuits. Microelectronics Reliability, 55(1), 238-250. Lien externe
Hamad, G. B., Mohamed, O. A., & Savaria, Y. (juillet 2015). Efficient Multilevel Formal Analysis and Estimation of Design Vulnerability to Single Event Transients [Communication écrite]. 21st International On-Line Testing Symposium (IOLTS 2015), Athena Pallas, Greece (6 pages). Lien externe
Hamad, G. B., Hasan, S. R., Mohamed, O. A., & Savaria, Y. (août 2014). Modeling, analyzing, and abstracting single event transient propagation at gate level [Communication écrite]. IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS 2014), College Station, TX, USA. Lien externe
