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Documents dont l'auteur est "Hähnel, Angelika"

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Nombre de documents: 9

H

Hähnel, A., Reiche, M., Moutanabbir, O., Blumtritt, H., Geisler, H., Hontschel, J., & Engelmann, H.-J. (2012). Improving accuracy and precision of strain analysis by energy-filtered nanobeam electron diffraction. Microscopy and Microanalysis, 18(1), 229-40. Lien externe

Hähnel, A., Reiche, M., Moutanabbir, O., Blumtritt, H., Geisler, H., Hoentschel, J., & Engelmann, H.-J. (2011). Nano‐beam electron diffraction evaluation of strain behaviour in nano‐scale patterned strained silicon‐on‐insulator. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics, 8(4), 1319-1324. Lien externe

M

Moutanabbir, O., Hähnel, A., Reiche, M., Erfurth, W., Tarun, A., Hayazawa, N., Kawata, S., Naumann, F., & Petzold, M. (2011). Strain Nano-Engineering: SSOI as a Playground. ECS Transactions, 35(5), 43-50. Lien externe

Moutanabbir, O., Reiche, M., Hähnel, A., Erfurth, W., Tarun, A., Hayazawa, N., Kawata, S., Naumann, F., & Petzold, M. (2011). Strain Nano-Engineering: SSOI as a Playground. ECS Meeting Abstracts, MA2011-01(23), 1415 (1 page). Lien externe

Moutanabbir, O., Reiche, M., Hähnel, A., Erfurth, W., Tarun, A., Hayazawa, N., Kawata, S., Naumann, F., & Petzold, M. (2010). Strain Stability in Nanoscale Patterned Strained Silicon-On-Insulator. ECS Transactions, 33(6), 511-522. Lien externe

Moutanabbir, O., Reiche, M., Hähnel, A., Erfurth, W., Motohashi, M., Tarun, A., Hayazawa, N., Kawata, S., Naumann, F., Pätzold, M., Holt, M. V., & Mäser, J. (2010). Strain Stability in Nanoscale Patterned Strained Silicon-on-Insulator. ECS Meeting Abstracts, MA2010-02(30), 1907 (1 page). Lien externe

Moutanabbir, O., Reiche, M., Hähnel, A., Erfurth, W., Naumann, F., Petzold, M., & Goesele, U. (2009). Probing the Strain States in Nanopatterned Strained SOI. ECS Transactions, 25(3), 187-194. Lien externe

Moutanabbir, O., Reiche, M., Zakharov, N. D., Hähnel, A., Erfurth, W., Naumann, F., Petzold, M., Holt, M. V., Mäser, J., & Goesele, U. (2009). Probing the Strain States in Nanopatterned Strained SOI. ECS Meeting Abstracts, MA2009-02(22), 1964-1964. Lien externe

R

Reiche, M., Moutanabbir, O., Hoentschel, J., Hähnel, A., Flachowsky, S., Gösele, U., & Horstmann, M. (2011). Strained Silicon Nanodevices. Dans Hanbücken, M., Müller, P., & Wehrspohn, R. B. (édit.), Mechanical Stress on the Nanoscale (p. 131-150). Lien externe

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