Angelika Hähnel, Manfred Reiche, Oussama Moutanabbir
, Horst Blumtritt, Holm Geisler, Jan Hontschel and Hans-Jurgen Engelmann
Article (2012)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/39713/ |
| Journal Title: | Microscopy and Microanalysis (vol. 18, no. 1) |
| Publisher: | Cambridge University Press |
| DOI: | 10.1017/s1431927611012657 |
| Official URL: | https://doi.org/10.1017/s1431927611012657 |
| Date Deposited: | 18 Apr 2023 15:11 |
| Last Modified: | 08 Apr 2025 07:03 |
| Cite in APA 7: | Hähnel, A., Reiche, M., Moutanabbir, O., Blumtritt, H., Geisler, H., Hontschel, J., & Engelmann, H.-J. (2012). Improving accuracy and precision of strain analysis by energy-filtered nanobeam electron diffraction. Microscopy and Microanalysis, 18(1), 229-40. https://doi.org/10.1017/s1431927611012657 |
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