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Improving accuracy and precision of strain analysis by energy-filtered nanobeam electron diffraction

Angelika Hahnel, Manfred Reiche, Oussama Moutanabbir, Horst Blumtritt, Holm Geisler, Jan Hontschel and Hans-Jurgen Engelmann

Article (2012)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/39713/
Journal Title: Microscopy and Microanalysis (vol. 18, no. 1)
Publisher: Cambridge University Press
DOI: 10.1017/s1431927611012657
Official URL: https://doi.org/10.1017/s1431927611012657
Date Deposited: 18 Apr 2023 15:11
Last Modified: 05 Apr 2024 11:35
Cite in APA 7: Hahnel, A., Reiche, M., Moutanabbir, O., Blumtritt, H., Geisler, H., Hontschel, J., & Engelmann, H.-J. (2012). Improving accuracy and precision of strain analysis by energy-filtered nanobeam electron diffraction. Microscopy and Microanalysis, 18(1), 229-40. https://doi.org/10.1017/s1431927611012657

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