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Baril, E., & L'Espérance, G. (1999). Studies of the morphology of the al-rich interfacial layer formed during the hot dip galvanizing of steel sheet. Metallurgical and Materials Transactions. A, Physical Metallurgy and Materials Science, 30(3A), 681-695. Lien externe
Blais, C., L'Espérance, G., & Baril, E. (1998). Characterization of 25-75 nm phases found at the peripyhery of multiphase inclusions: techniques comparison and selection. Journal of Microscopy, 189(3), 249-262. Lien externe
Baril, E., L'Espérance, G., & Boutin, É. Effect of process parameters on inhibition breakdown mechanisms during hot dip galvannealing [Communication écrite]. GALVATECH 1998. Non disponible
Blais, C., L'Espérance, G., Baril, E., & St-Pierre, E. (janvier 1997). Complete characterization of second phase particles using a system integrating SEM, image analysis and EDS [Communication écrite]. IMS-Microstructural science, Seattle, USA. Non disponible
Blais, C., L'Espérance, G., Baril, E., & Forget, C. (août 1996). Characterization of small inclusions: SEM vs TEM, or is it even worth considering SEM [Communication écrite]. Microscopy and microanalysis 1996, Minneapolis, MN (United States). Non disponible
Blais, C., L'Espérance, G., Baril, E., & Forget, C. (janvier 1995). Estimation of errors resulting from stereological measurements of inclusions characterized by X-ray mapping in SEM [Communication écrite]. Microbeam analysis society 1995, Colorado, USA. Non disponible
Hovington, P., L'Espérance, G., Baril, E., & Rigaud, M. (1995). Monitoring the performance of energy-dispersive spectrometer detectors at low-energy. Journal of scanning microscopy, 17(3), 136-138. Lien externe
L'Espérance, G., Hovington, P., Baril, E., & Blais, C. (janvier 1994). Procedures and samples to monitor the long term low energy performance of energy-dispersive X-ray spectrometers [Communication écrite]. Réunion conjointe microscopy society of america (52ieme réunion annuelle) et microbeam analysis society (28ieme réunion annuelle), Nouvelle-Orléan, Louisiana, USA. Non disponible
Tremblay, S., Ronaldi, J., Baril, E., Laroche, S., L'Espérance, G., & Baseotto, G. (1997). Système de caractérisation des matériaux intégrés pour les microscopies optiques et électroniques, l'analyse d'images et la spectrométrie EDX. Revue matériaux et techniques (11-12), 57-60. Non disponible
