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Collaboration networkThis graph maps the connections between all the collaborators of {}'s publications listed on this page.
Each link represents a collaboration on the same publication. The thickness of the link represents the number of collaborations.
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Hold down the "Ctrl" key or the "⌘" key while clicking on the nodes to open the list of this person's publications.
Word cloudA word cloud is a visual representation of the most frequently used words in a text or a set of texts. The words appear in different sizes, with the size of each word being proportional to its frequency of occurrence in the text. The more frequently a word is used, the larger it appears in the word cloud. This technique allows for a quick visualization of the most important themes and concepts in a text.
In the context of this page, the word cloud was generated from the publications of the author {}. The words in this cloud come from the titles, abstracts, and keywords of the author's articles and research papers. By analyzing this word cloud, you can get an overview of the most recurring and significant topics and research areas in the author's work.
The word cloud is a useful tool for identifying trends and main themes in a corpus of texts, thus facilitating the understanding and analysis of content in a visual and intuitive way.
Baril, E., L'Espérance, G., & Boutin, É. Effect of process parameters on inhibition breakdown mechanisms during hot dip galvannealing [Paper]. GALVATECH 1998. Unavailable
Blais, C., L'Espérance, G., Baril, E., & St-Pierre, E. (1997, January). Complete characterization of second phase particles using a system integrating SEM, image analysis and EDS [Paper]. IMS-Microstructural science, Seattle, USA. Unavailable
Blais, C., L'Espérance, G., Baril, E., & Forget, C. (1996, August). Characterization of small inclusions: SEM vs TEM, or is it even worth considering SEM [Paper]. Microscopy and microanalysis 1996, Minneapolis, MN (United States). Unavailable
Blais, C., L'Espérance, G., Baril, E., & Forget, C. (1995, August). Estimation of errors resulting from stereological measurements of inclusions characterized by X-ray mapping in SEM [Paper]. Microbeam analysis society 1995, Breckenridge, Colorado, USA. Unavailable
Hovington, P., L'Espérance, G., Baril, E., & Rigaud, M. (1995). Monitoring the performance of energy-dispersive spectrometer detectors at low-energy. Journal of scanning microscopy, 17(3), 136-138. External link
L'Espérance, G., Hovington, P., Baril, E., & Blais, C. (1994, January). Procedures and samples to monitor the long term low energy performance of energy-dispersive X-ray spectrometers [Paper]. Réunion conjointe microscopy society of america (52ieme réunion annuelle) et microbeam analysis society (28ieme réunion annuelle), Nouvelle-Orléan, Louisiana, USA. Unavailable
Tremblay, S., Ronaldi, J., Baril, E., Laroche, S., L'Espérance, G., & Baseotto, G. (1997). Système de caractérisation des matériaux intégrés pour les microscopies optiques et électroniques, l'analyse d'images et la spectrométrie EDX. Revue matériaux et techniques (11-12), 57-60. Unavailable
