C. Blais, Gilles L'Espérance
, E. Baril and C. Forget
Paper (1996)
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| Additional Information: | Nom historique du département: Département de métallurgie et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| PolyPublie URL: | https://publications.polymtl.ca/31495/ |
| Conference Title: | Microscopy and microanalysis 1996 |
| Conference Location: | Minneapolis, MN (United States) |
| Conference Date(s): | 1996-08-11 - 1996-08-15 |
| Publisher: | San Francisco Press |
| Date Deposited: | 18 Apr 2023 15:24 |
| Last Modified: | 25 Sep 2024 16:13 |
| Cite in APA 7: | Blais, C., L'Espérance, G., Baril, E., & Forget, C. (1996, August). Characterization of small inclusions: SEM vs TEM, or is it even worth considering SEM [Paper]. Microscopy and microanalysis 1996, Minneapolis, MN (United States). |
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