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Characterization of small inclusions: SEM vs TEM, or is it even worth considering SEM

C. Blais, Gilles L'Espérance, E. Baril and C. Forget

Paper (1996)

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Additional Information: Nom historique du département: Département de métallurgie et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/31495/
Conference Title: Microscopy and microanalysis 1996
Conference Location: Minneapolis, MN (United States)
Conference Date(s): 1996-08-11 - 1996-08-15
Publisher: San Francisco Press
Date Deposited: 18 Apr 2023 15:24
Last Modified: 05 Apr 2024 11:21
Cite in APA 7: Blais, C., L'Espérance, G., Baril, E., & Forget, C. (1996, August). Characterization of small inclusions: SEM vs TEM, or is it even worth considering SEM [Paper]. Microscopy and microanalysis 1996, Minneapolis, MN (United States).

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