C. Blais, Gilles L'Espérance
, E. Baril and E. St-Pierre
Paper (1997)
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| Additional Information: | Nom historique du département: Département de métallurgie et de génie des matériaux |
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| Department: | Department of Engineering Physics |
| PolyPublie URL: | https://publications.polymtl.ca/30648/ |
| Conference Title: | IMS-Microstructural science |
| Conference Location: | Seattle, USA |
| Conference Date(s): | 1997-01-01 - 1997-12-31 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 25 Sep 2024 16:12 |
| Cite in APA 7: | Blais, C., L'Espérance, G., Baril, E., & St-Pierre, E. (1997, January). Complete characterization of second phase particles using a system integrating SEM, image analysis and EDS [Paper]. IMS-Microstructural science, Seattle, USA. |
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