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Complete characterization of second phase particles using a system integrating SEM, image analysis and EDS

C. Blais, Gilles L'Espérance, E. Baril and E. St-Pierre

Paper (1997)

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Additional Information: Nom historique du département: Département de métallurgie et de génie des matériaux
Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/30648/
Conference Title: IMS-Microstructural science
Conference Location: Seattle, USA
Conference Date(s): 1997-01-01 - 1997-12-31
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:20
Cite in APA 7: Blais, C., L'Espérance, G., Baril, E., & St-Pierre, E. (1997, January). Complete characterization of second phase particles using a system integrating SEM, image analysis and EDS [Paper]. IMS-Microstructural science, Seattle, USA.

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