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Word cloudA word cloud is a visual representation of the most frequently used words in a text or a set of texts. The words appear in different sizes, with the size of each word being proportional to its frequency of occurrence in the text. The more frequently a word is used, the larger it appears in the word cloud. This technique allows for a quick visualization of the most important themes and concepts in a text.
In the context of this page, the word cloud was generated from the publications of the author {}. The words in this cloud come from the titles, abstracts, and keywords of the author's articles and research papers. By analyzing this word cloud, you can get an overview of the most recurring and significant topics and research areas in the author's work.
The word cloud is a useful tool for identifying trends and main themes in a corpus of texts, thus facilitating the understanding and analysis of content in a visual and intuitive way.
Attiaoui, A., Assali, S., Luo, L., Daligou, G. T. E. G., Atalla, M., Koelling, S., & Moutanabbir, O. (2022, July). Group-IV GeSn nanophotonics [Paper]. IEEE Photonics Society Summer Topicals Meeting Series (SUM 2022), Cabo San Lucas, Mexico (2 pages). External link
Atalla, M., Assali, S., Koelling, S., Daligou, G. T. E. G., Attiaoui, A., Luo, L., Lemieux-Leduc, C., Abdi, S., & Moutanabbir, O. (2022, May). Mid-infrared silicon-integrated high-bandwidth GeSn PIN photodetectors and LEDs [Paper]. Conference on Lasers and Electro-Optics (CLEO 2022), San José, CA, USA (2 pages). External link
Assali, S., Attiaoui, A., Atalla, M., Alain, D., Kumar, A., Mukherjee, S., Nicolas, J., Koelling, S., & Moutanabbir, O. (2020, October). Engineering SiGeSn Semiconductors for MIR and THz Opto-electronic Devices [Paper]. ECS Meeting Abstracts. External link
Abdi, S., Atalla, M., Assali, S., Kumar, A., Groell, L., Koelling, S., & Moutanabbir, O. (2020). Towards Ultra-Low Specific Contact Resistance on P-Type and N-Type Narrow Bandgap GeSn Semiconductors. ECS Meeting Abstracts, MA2020-01(22), 1322-1322. External link
Assali, S., Abdi, S., Atalla, M., Attiaoui, A., Bouthillier, É., Del Vecchio, P., Groell, L., Kumar, A., Luo, L., Mukherjee, S., Nicolas, J., & Moutanabbir, O. (2019, October). (Si)GeSn Semiconductors for Integrated Optoelectronics, Quantum Electronics, and More [Abstract]. 236th ECS Meeting, Atlanta, GA. Published in ECS Meeting Abstracts, MA2019-02(25). External link
Daligou, G. T. E. G., Soref, R., Attiaoui, A., Hossain, J., Atalla, M., Del Vecchio, P., & Moutanabbir, O. (2023). Group IV mid-infrared thermophotovoltaic cells on silicon. IEEE Journal of Photovoltaics, 13(5), 728-735. External link
Groell, L., Abdi, S., Assali, S., Atalla, M., Attiaoui, A., & Moutanabbir, O. (2020, May). Germanium Tin Surface Passivation and Its Effect on the Optoelectronic Performances [Paper]. 237th ECS Meeting with the 18th International Meeting on Chemical Sensors (IMCS 2020), Montreal, Canada. External link
Koelling, S., Assali, S., Atalla, M., Kumar, A., Attiaoui, A., Lodari, M., Sammak, A., Scappucci, G., & Moutanabbir, O. (2020, October). (Invited) Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale [Paper]. SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9, Honolulu, Hawaii, USA. External link
Koelling, S., Assali, S., Atalla, M., Kumar, A., Attiaoui, A., Lodari, M., Sammak, A., Scappucci, G., & Moutanabbir, O. Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale [Paper]. SiGe, Ge, and Related Compounds: Materials, Processing, and Devices (PRiME 2020). Published in ECS Transactions, 98(5). External link
Montpetit, L., Singh, S., Atalla, M., Lemieux-Leduc, C., Nadal, G., & Moutanabbir, O. (2024, October). CdZnTe surface conditioning using Ar plasma [Abstract]. IEEE Nuclear Science Symposium (NSS 2024), Medical Imaging Conference (MIC 2024) and Room Temperature Semiconductor Detector Conference (RTSD 2024), Tampa, FL, USA. External link
Singh, S., Montpetit, L., Nadal, G., Atalla, M., Rahier, E., Koelling, S., & Moutanabbir, O. (2024, October). Impact of Br-etching on surface and current-voltage characteristics of CZT detector [Abstract]. IEEE Nuclear Science Symposium (NSS 2024), Medical Imaging Conference (MIC 2024) and Room Temperature Semiconductor Detector Conference (RTSD 2024), Tampa, FL, USA. External link
