Sebastian Koelling, Simone Assali, Mahmoud Atalla, Aashish Kumar, Anis Attiaoui, Mario Lodari, Amir Sammak, Giordano Scappucci and Oussama Moutanabbir
Paper (2020)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/52852/ |
| Conference Title: | SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9 |
| Conference Location: | Honolulu, Hawaii, USA |
| Conference Date(s): | 2020-10-04 - 2020-10-09 |
| Journal Title: | ECS Meeting Abstracts (vol. MA2020-02, no. 24) |
| Publisher: | IOP Science |
| DOI: | 10.1149/ma2020-02241770mtgabs |
| Official URL: | https://doi.org/10.1149/ma2020-02241770mtgabs |
| Date Deposited: | 18 Apr 2023 15:01 |
| Last Modified: | 11 Dec 2025 16:57 |
| Cite in APA 7: | Koelling, S., Assali, S., Atalla, M., Kumar, A., Attiaoui, A., Lodari, M., Sammak, A., Scappucci, G., & Moutanabbir, O. (2020, October). (Invited) Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale [Paper]. SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9, Honolulu, Hawaii, USA. Published in ECS Meeting Abstracts, MA2020-02(24). https://doi.org/10.1149/ma2020-02241770mtgabs |
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