Sebastian Koelling, Simone Assali, Mahmoud Atalla, Aashish Kumar, Anis Attiaoui, Mario Lodari, Amir Sammak, Giordano Scappucci and Oussama Moutanabbir
Paper (2020)
An external link is available for this itemDepartment: | Department of Engineering Physics |
---|---|
PolyPublie URL: | https://publications.polymtl.ca/52852/ |
Conference Title: | SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9 |
Conference Location: | Honolulu, Hawaii, USA |
Conference Date(s): | 2020-10-04 - 2020-10-09 |
Publisher: | IOP Science |
DOI: | 10.1149/ma2020-02241770mtgabs |
Official URL: | https://doi.org/10.1149/ma2020-02241770mtgabs |
Date Deposited: | 18 Apr 2023 15:01 |
Last Modified: | 25 Sep 2024 16:43 |
Cite in APA 7: | Koelling, S., Assali, S., Atalla, M., Kumar, A., Attiaoui, A., Lodari, M., Sammak, A., Scappucci, G., & Moutanabbir, O. (2020, October). (Invited) Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale [Paper]. SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9, Honolulu, Hawaii, USA. https://doi.org/10.1149/ma2020-02241770mtgabs |
---|---|
Statistics
Dimensions