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(Invited) Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale

Sebastian Koelling, Simone Assali, Mahmoud Atalla, Aashish Kumar, Anis Attiaoui, Mario Lodari, Amir Sammak, Giordano Scappucci and Oussama Moutanabbir

Paper (2020)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/52852/
Conference Title: SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9
Conference Location: Honolulu, Hawaii, USA
Conference Date(s): 2020-10-04 - 2020-10-09
Publisher: IOP Science
DOI: 10.1149/ma2020-02241770mtgabs
Official URL: https://doi.org/10.1149/ma2020-02241770mtgabs
Date Deposited: 18 Apr 2023 15:01
Last Modified: 05 Apr 2024 11:57
Cite in APA 7: Koelling, S., Assali, S., Atalla, M., Kumar, A., Attiaoui, A., Lodari, M., Sammak, A., Scappucci, G., & Moutanabbir, O. (2020, October). (Invited) Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale [Paper]. SiGe, Ge, and Related Compounds: Materials, Processing, and Devices 9, Honolulu, Hawaii, USA. https://doi.org/10.1149/ma2020-02241770mtgabs

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