Impact of Br-etching on surface and current-voltage characteristics of CZT detector

Sudarshan Singh, L. Montpetit, Guillaume Nadal, Mahmoud Atalla, Eloïse Rahier, Sebastian Koelling and Oussama Moutanabbir

Abstract (2024)

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Department:	Department of Engineering Physics
ISBN:	9798350388152
PolyPublie URL:	https://publications.polymtl.ca/62728/
Conference Title:	IEEE Nuclear Science Symposium (NSS 2024), Medical Imaging Conference (MIC 2024) and Room Temperature Semiconductor Detector Conference (RTSD 2024)
Conference Location:	Tampa, FL, USA
Conference Date(s):	2024-10-26 - 2024-11-02
Publisher:	Institute of Electrical and Electronics Engineers
DOI:	10.1109/nss/mic/rtsd57108.2024.10658438
Official URL:	https://doi.org/10.1109/nss/mic/rtsd57108.2024.106...
Date Deposited:	14 Feb 2025 14:31
Last Modified:	14 Feb 2025 14:31

Cite in APA 7:

Singh, S., Montpetit, L., Nadal, G., Atalla, M., Rahier, E., Koelling, S., & Moutanabbir, O. (2024, October). Impact of Br-etching on surface and current-voltage characteristics of CZT detector [Abstract]. IEEE Nuclear Science Symposium (NSS 2024), Medical Imaging Conference (MIC 2024) and Room Temperature Semiconductor Detector Conference (RTSD 2024), Tampa, FL, USA. https://doi.org/10.1109/nss/mic/rtsd57108.2024.10658438

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