Sebastian Koelling, Simone Assali, Mahmoud Atalla, Aashish Kumar, Anis Attiaoui, Mario Lodari, Amir Sammak, Giordano Scappucci and Oussama Moutanabbir
Paper (2020)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/46812/ |
| Conference Title: | SiGe, Ge, and Related Compounds: Materials, Processing, and Devices (PRiME 2020) |
| Journal Title: | ECS Transactions (vol. 98, no. 5) |
| Publisher: | The Electrochemical Society |
| DOI: | 10.1149/09805.0447ecst |
| Official URL: | https://doi.org/10.1149/09805.0447ecst |
| Date Deposited: | 18 Apr 2023 15:01 |
| Last Modified: | 25 Sep 2024 16:35 |
| Cite in APA 7: | Koelling, S., Assali, S., Atalla, M., Kumar, A., Attiaoui, A., Lodari, M., Sammak, A., Scappucci, G., & Moutanabbir, O. Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale [Paper]. SiGe, Ge, and Related Compounds: Materials, Processing, and Devices (PRiME 2020). Published in ECS Transactions, 98(5). https://doi.org/10.1149/09805.0447ecst |
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