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Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale

Sebastian Koelling, Simone Assali, Mahmoud Atalla, Aashish Kumar, Anis Attiaoui, Mario Lodari, Amir Sammak, Giordano Scappucci and Oussama Moutanabbir

Paper (2020)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/46812/
Conference Title: SiGe, Ge, and Related Compounds: Materials, Processing, and Devices (PRiME 2020)
Journal Title: ECS Transactions (vol. 98, no. 5)
Publisher: The Electrochemical Society
DOI: 10.1149/09805.0447ecst
Official URL: https://doi.org/10.1149/09805.0447ecst
Date Deposited: 18 Apr 2023 15:01
Last Modified: 05 Apr 2024 11:47
Cite in APA 7: Koelling, S., Assali, S., Atalla, M., Kumar, A., Attiaoui, A., Lodari, M., Sammak, A., Scappucci, G., & Moutanabbir, O. Probing Semiconductor Heterostructures from the Atomic to the Micrometer Scale [Paper]. SiGe, Ge, and Related Compounds: Materials, Processing, and Devices (PRiME 2020). Published in ECS Transactions, 98(5). https://doi.org/10.1149/09805.0447ecst

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