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Documents dont l'auteur est "Abderrahman, A."

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Nombre de documents: 7

Abderrahman, A., Savaria, Y., Khouas, A., & Sawan, M. (août 2007). Accurate testability analysis based-on multi-frequency test generation and a new testability metric [Communication écrite]. IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007), Montréal, Québec. Lien externe

Abderrahman, A., Savaria, Y., Khouas, A., & Sawan, M. (décembre 2007). New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches [Communication écrite]. 14th IEEE International Conference on Electronics, Circuits and Systems, Marrakech, Morocco. Lien externe

Abderrahman, A., Cerny, E., & Kaminska, B. (1999). Worst Case Tolerance Analysis and Clp-Based Multifrequency Test Generation for Analog Circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 18(3), 332-345. Lien externe

Abderrahman, A., Cerny, E., & Kaminska, B. (avril 1997). CLP-based multifrequency test generation for analog circuits [Communication écrite]. 1997 15th VLSI Test Symposium, Monterey, CA, USA. Lien externe

Abderrahman, A., Savaria, Y., & Kaminska, B. (1996). Analyse, estimation et réduction du bruit de commutation simultanée. [Analysis, estimation and reduction of simultaneous switching noise]. Canadian Journal of Electrical and Computer Engineering, 21(4), 133-143. Lien externe

Abderrahman, A., Cerny, E., & Kaminska, B. (1996). Optimization-based multifrequency test generation for analog circuits. Journal of Electronic Testing: Theory and Applications (JETTA), 9(1-2), 59-73. Lien externe

Abderrahman, A., Kaminska, B., & Savaria, Y. (février 1994). Estimation of simultaneous switching power and ground noise of static CMOS combinational circuits [Communication écrite]. European Design and Test Conference, Paris, Fr. Lien externe

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