A. Abderrahman, Yvon Savaria
, Abdelhakim Khouas and Mohamad Sawan
Paper (2007)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| ISBN: | 9781424413775 |
| PolyPublie URL: | https://publications.polymtl.ca/22342/ |
| Conference Title: | 14th IEEE International Conference on Electronics, Circuits and Systems |
| Conference Location: | Marrakech, Morocco |
| Conference Date(s): | 2007-12-11 - 2007-12-14 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/icecs.2007.4510936 |
| Official URL: | https://doi.org/10.1109/icecs.2007.4510936 |
| Date Deposited: | 18 Apr 2023 15:16 |
| Last Modified: | 08 Apr 2025 02:10 |
| Cite in APA 7: | Abderrahman, A., Savaria, Y., Khouas, A., & Sawan, M. (2007, December). New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches [Paper]. 14th IEEE International Conference on Electronics, Circuits and Systems, Marrakech, Morocco. https://doi.org/10.1109/icecs.2007.4510936 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
