A. Abderrahman, E. Cerny and Bozena Kaminska
Paper (1997)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
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| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/30741/ |
| Conference Title: | 1997 15th VLSI Test Symposium |
| Conference Location: | Monterey, CA, USA |
| Conference Date(s): | 1997-04-27 - 1997-05-01 |
| Publisher: | IEEE |
| DOI: | 10.1109/vtest.1997.600241 |
| Official URL: | https://doi.org/10.1109/vtest.1997.600241 |
| Date Deposited: | 18 Apr 2023 15:23 |
| Last Modified: | 08 Apr 2025 02:21 |
| Cite in APA 7: | Abderrahman, A., Cerny, E., & Kaminska, B. (1997, April). CLP-based multifrequency test generation for analog circuits [Paper]. 1997 15th VLSI Test Symposium, Monterey, CA, USA. https://doi.org/10.1109/vtest.1997.600241 |
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