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CLP-based multifrequency test generation for analog circuits

A. Abderrahman, E. Cerny and Bozena Kaminska

Paper (1997)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/30741/
Conference Title: 1997 15th VLSI Test Symposium
Conference Location: Monterey, CA, USA
Conference Date(s): 1997-04-27 - 1997-05-01
Publisher: IEEE
DOI: 10.1109/vtest.1997.600241
Official URL: https://doi.org/10.1109/vtest.1997.600241
Date Deposited: 18 Apr 2023 15:23
Last Modified: 05 Apr 2024 11:20
Cite in APA 7: Abderrahman, A., Cerny, E., & Kaminska, B. (1997, April). CLP-based multifrequency test generation for analog circuits [Paper]. 1997 15th VLSI Test Symposium, Monterey, CA, USA. https://doi.org/10.1109/vtest.1997.600241



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