A. Abderrahman, Yvon Savaria
, Abdelhakim Khouas and Mohamad Sawan
Paper (2007)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 1424411645 |
| PolyPublie URL: | https://publications.polymtl.ca/22341/ |
| Conference Title: | IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007) |
| Conference Location: | Montréal, Québec |
| Conference Date(s): | 2007-08-05 - 2007-08-08 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| DOI: | 10.1109/newcas.2007.4488018 |
| Official URL: | https://doi.org/10.1109/newcas.2007.4488018 |
| Date Deposited: | 18 Apr 2023 15:16 |
| Last Modified: | 08 Apr 2025 02:10 |
| Cite in APA 7: | Abderrahman, A., Savaria, Y., Khouas, A., & Sawan, M. (2007, August). Accurate testability analysis based-on multi-frequency test generation and a new testability metric [Paper]. IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007), Montréal, Québec. https://doi.org/10.1109/newcas.2007.4488018 |
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