Claude Thibeault, Yvon Savaria
, Jean-Louis Houle
Technical Report (1990)
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Abstract
Yield modeling -- Yield modeling with EEs assumed statistically independent -- Equivalence between the inclusion/exclusion and the combinatorial approaches -- Equivalence between the inclusion/exclusion principle and modeling assuming independence.
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Report number:
EPM-RT-90-11
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oai:publications.polymtl.ca:9642
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22 Nov 2021 16:36
Last Modified:
14 Oct 2026 10:53
Cite in APA 7:
Thibeault, C., Savaria, Y., & Houle, J.-L. (1990). Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits. (Technical Report n° EPM-RT-90-11). https://publications.polymtl.ca/9642/
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