Ghaith Bany Hamad, Ghaith Kazma, Otmane Aı̈t Mohamed and Yvon Savaria
Paper (2016)
An external link is available for this item
| Department: | Department of Electrical Engineering |
|---|---|
| Research Center: | GR2M - Microelectronics and Microsystems Research Group |
| ISBN: | 9791092279177 |
| PolyPublie URL: | https://publications.polymtl.ca/36967/ |
| Conference Title: | Forum on Specification and Design Languages (FDL 2016) |
| Conference Location: | Bremen, Germany |
| Conference Date(s): | 2016-09-14 - 2016-09-16 |
| Publisher: | IEEE |
| DOI: | 10.1109/fdl.2016.7880371 |
| Official URL: | https://doi.org/10.1109/fdl.2016.7880371 |
| Date Deposited: | 18 Apr 2023 15:05 |
| Last Modified: | 08 Apr 2025 12:21 |
| Cite in APA 7: | Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (2016, September). Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients [Paper]. Forum on Specification and Design Languages (FDL 2016), Bremen, Germany (7 pages). https://doi.org/10.1109/fdl.2016.7880371 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
