Ginette Monté-Genest, Bernard Antaki, Serge Patenaude, Yvon Savaria
, Claude Thibeault and Pieter Trouborst
Paper (2001)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| PolyPublie URL: | https://publications.polymtl.ca/27191/ |
| Conference Title: | 19th IEEE VLSI Test Symposium (VTS 2001) |
| Conference Location: | Marina Del Rey, CA, USA |
| Conference Date(s): | 2001-04-29 - 2001-05-03 |
| Publisher: | IEEE Comput. Soc |
| DOI: | 10.1109/vts.2001.923467 |
| Official URL: | https://doi.org/10.1109/vts.2001.923467 |
| Date Deposited: | 18 Apr 2023 15:21 |
| Last Modified: | 25 Sep 2024 16:07 |
| Cite in APA 7: | Monté-Genest, G., Antaki, B., Patenaude, S., Savaria, Y., Thibeault, C., & Trouborst, P. (2001, April). Tools for the characterization of bipolar CML testability [Paper]. 19th IEEE VLSI Test Symposium (VTS 2001), Marina Del Rey, CA, USA. https://doi.org/10.1109/vts.2001.923467 |
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