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Tools for the characterization of bipolar CML testability

G. Monte, B. Antaki, S. Patenaude, Yvon Savaria, C. Thibeault and P. Trouborst

Paper (2001)

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Additional Information: Nom historique du département: Département de génie électrique et de génie informatique
Department: Department of Electrical Engineering
Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/27191/
Conference Title: 19th IEEE VLSI Test Symposium (VTS 2001)
Conference Location: Marina Del Rey, CA, USA
Conference Date(s): 2001-04-29 - 2001-05-03
Publisher: IEEE Comput. Soc
DOI: 10.1109/vts.2001.923467
Official URL: https://doi.org/10.1109/vts.2001.923467
Date Deposited: 18 Apr 2023 15:21
Last Modified: 05 Apr 2024 11:14
Cite in APA 7: Monte, G., Antaki, B., Patenaude, S., Savaria, Y., Thibeault, C., & Trouborst, P. (2001, April). Tools for the characterization of bipolar CML testability [Paper]. 19th IEEE VLSI Test Symposium (VTS 2001), Marina Del Rey, CA, USA. https://doi.org/10.1109/vts.2001.923467

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