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Collaboration networkThis graph maps the connections between all the collaborators of {}'s publications listed on this page.
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Word cloudA word cloud is a visual representation of the most frequently used words in a text or a set of texts. The words appear in different sizes, with the size of each word being proportional to its frequency of occurrence in the text. The more frequently a word is used, the larger it appears in the word cloud. This technique allows for a quick visualization of the most important themes and concepts in a text.
In the context of this page, the word cloud was generated from the publications of the author {}. The words in this cloud come from the titles, abstracts, and keywords of the author's articles and research papers. By analyzing this word cloud, you can get an overview of the most recurring and significant topics and research areas in the author's work.
The word cloud is a useful tool for identifying trends and main themes in a corpus of texts, thus facilitating the understanding and analysis of content in a visual and intuitive way.
Adham, S. M. I., Savaria, Y., Antaki, B., & Xiong, N. (2000). Voltage excursion detection apparatus. (Patent no. US6100716). External link
Antaki, B., Savaria, Y., Adham, S., Xiong, N., Borrione, D., & Ernst, R. (1999, March). Design for testability method for CML digital circuits [Paper]. Design, Automation and Test in Europe Conference and Exhibition (DATE 1999), Munich, Germany. External link
Antaki, B. (1999). Étude de la défaillance des circuits bipolaires en mode courant et leur testabilité [Master's thesis, École Polytechnique de Montréal]. Available
Antaki, B., Patenaude, S., Trognon, L., & Savaria, Y. (1997, June). Study on split-output TSPC CMOS circuits [Paper]. IEEE International Symposium on Circuits and Systems (ISCAS 1997), Hong Kong, Hong Kong. External link
Monté-Genest, G., Antaki, B., Patenaude, S., Savaria, Y., Thibeault, C., & Trouborst, P. (2001, April). Tools for the characterization of bipolar CML testability [Paper]. 19th IEEE VLSI Test Symposium (VTS 2001), Marina Del Rey, CA, USA. External link
