Bernard Antaki, Yvon Savaria
, Saman Adham, Nanhan Xiong, D. Borrione and R. Ernst
Paper (1999)
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| Additional Information: | Nom historique du département: Département de génie électrique et de génie informatique |
|---|---|
| Department: |
Department of Electrical Engineering Department of Computer Engineering and Software Engineering |
| ISBN: | 0769500781 |
| PolyPublie URL: | https://publications.polymtl.ca/29177/ |
| Conference Title: | Design, Automation and Test in Europe Conference and Exhibition (DATE 1999) |
| Conference Location: | Munich, Germany |
| Conference Date(s): | 1999-03-09 - 1999-03-12 |
| Publisher: | IEEE Comput. Soc |
| DOI: | 10.1109/date.1999.761146 |
| Other DOIs related to this document: | 10.1145/307418.307523 |
| Official URL: | https://doi.org/10.1109/date.1999.761146 |
| Date Deposited: | 18 Apr 2023 15:22 |
| Last Modified: | 05 Sep 2025 13:28 |
| Cite in APA 7: | Antaki, B., Savaria, Y., Adham, S., Xiong, N., Borrione, D., & Ernst, R. (1999, March). Design for testability method for CML digital circuits [Paper]. Design, Automation and Test in Europe Conference and Exhibition (DATE 1999), Munich, Germany. https://doi.org/10.1109/date.1999.761146 |
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