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Yield formula for two-level hierarchical fault-tolerant integrated circuit

Claude Thibeault, Yvon Savaria, Jean-Louis Houle

Technical Report (1988)

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Abstract

Hierarchical fault-tolerance -- A new yield formula -- Particular cases.

Uncontrolled Keywords

Circuits intégrés -- Tolérance aux fautes -- Modèles mathématiques

Department: Department of Electrical Engineering
PolyPublie URL: https://publications.polymtl.ca/10167/
Report number: EPM-RT-88-25
Date Deposited: 07 Feb 2022 14:00
Last Modified: 11 Nov 2022 02:18
Cite in APA 7: Thibeault, C., Savaria, Y., & Houle, J.-L. (1988). Yield formula for two-level hierarchical fault-tolerant integrated circuit (Technical Report n° EPM-RT-88-25). https://publications.polymtl.ca/10167/

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