Documents publiés en "2017"

A

Ammar, M., Bany Hamad, G., Mohamed, O. A., & Savaria, Y. (2017). System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking. IEEE Transactions on Nuclear Science, 64(9), 2523-2530. Lien externe

Ammar, M., Bany Hamad, G., Mohamed, O. A.̈., Savaria, Y., & Velazco, R. (septembre 2016). Comprehensive vulnerability analysis of systems exposed to SEUs via probabilistic model checking [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe

B

Bany Hamad, G. (2017). Multilevel Modeling, Formal Analysis, and Characterization of Single Event Transients Propagation in Digital Systems [Thèse de doctorat, École Polytechnique de Montréal]. Disponible

Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (2017). Formal Methods Based Synthesis of Single Event Transient Tolerant Combinational Circuits. Journal of Electronic Testing: Theory and Applications, 33(5), 607-620. Lien externe

Bany Hamad, G., Kazma, G., Mohamed, O. A.̈., & Savaria, Y. (juillet 2017). Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT [Communication écrite]. 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, Greece. Lien externe

Bany Hamad, G., Mohamed, O. A.̈., & Savaria, Y. (septembre 2016). Investigating the efficiency of cell level hardening techniques of single event transients via SMT [Communication écrite]. 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2016), Bremen, Germany (4 pages). Lien externe

K

Kazma, G., Bany Hamad, G., Ait Mohamed, O., & Savaria, Y. (juin 2017). Analysis of SEU propagation in sequential circuits at RTL using Satisfiability Modulo Theories [Communication écrite]. 15th IEEE International New Circuits and Systems Conference (NEWCAS 2017), Strasbourg, France. Lien externe