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Darvishi, M., Audet, Y., Blaquiere, Y., Thibeault, C., & Pichette, S. (2019). On the susceptibility of SRAM-Based FPGA routing network to delay changes induced by ionizing radiation. IEEE Transactions on Nuclear Science, 66(3), 643-654. Lien externe
Darvishi, M., Audet, Y., Blaquiere, Y., Thibeault, C., Pichette, S., & Tazi, F. Z. (2014). Circuit level modeling of extra combinational delays in SRAM-based FPGAs due to transient ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3535-3542. Lien externe
Tazi, F. Z., Thibeault, C., Savaria, Y., Pichette, S., & Audet, Y. (2014). On extra delays affecting I/O blocks of an SRAM-based FPGA due to ionizing radiation. IEEE Transactions on Nuclear Science, 61(6), 3138-3145. Lien externe
Hobeika, C., Pichette, S., Ghodbane, A., Thibeault, C., Audet, Y., Boland, J.-F., & Saad, M. (2013). Flight control fault models based on SEU emulation. SAE International Journal of Aerospace, 6(2), 643-649. Lien externe
Thibeault, C., Pichette, S., Audet, Y., Savaria, Y., Rufenacht, H., Gloutnay, E., Blaquière, Y., Moupfouma, F., & Batani, N. (2012). On Extra Combinational Delays in SRAM FPGAs Due to Transient Ionizing Radiations. IEEE Transactions on Nuclear Science, 59(6), 2959-65. Lien externe
