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Boudjella, A., Jin, Z.-F., & Savaria, Y. (octobre 2003). Electrical field analysis of nanoscaled field effect transistors [Communication écrite]. International Microprocesses and Nanotechnology Conference, Tokyo, Japan. Lien externe
Jin, Z.-F., Yang, M., Savaria, Y., & Wu, K. (juillet 2004). Analysis of gate modulation in nanoscale field effect transistors using an equivalent substrate integrated waveguide (SIW) model [Communication écrite]. 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference (ANTEM/URSI 2004), Ottawa, Ont., Canada. Lien externe
Jin, Z.-F., & Laurin, J.-J. (juillet 2004). A distance-detecting method for planar near-field measurements using a printed ring resonator [Communication écrite]. 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference (ANTEM 2004), Ottawa, Ont., Canada. Lien externe
Jin, Z.-F., Laurin, J.-J., & Savaria, Y. Comparison of Propagation Characteristics Between Single and Coupled Mis Interconnect Topologies in Vlsi Circuits [Communication écrite]. Canadian Conference on Electrical and Computer Engineering (CCECE 2003). Lien externe
Jin, Z.-F., Laurin, J.-J., & Savaria, Y. (2002). A practical approach to model long MIS interconnects in VLSI circuits. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 10(4), 494-507. Lien externe
Jin, Z.-F., Laurin, J.-J., & Savaria, Y. New approach to analyze interconnect delays in RC wire models [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 1999). Non disponible
