Aissa Boudjella, Zhong-Fang Jin and Yvon Savaria
Paper (2003)
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| Department: | Department of Electrical Engineering |
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| ISBN: | 4891140402 |
| PolyPublie URL: | https://publications.polymtl.ca/26076/ |
| Conference Title: | International Microprocesses and Nanotechnology Conference |
| Conference Location: | Tokyo, Japan |
| Conference Date(s): | 2003-10-29 - 2003-10-31 |
| Publisher: | IEEE |
| DOI: | 10.1109/imnc.2003.1268735 |
| Official URL: | https://doi.org/10.1109/imnc.2003.1268735 |
| Date Deposited: | 18 Apr 2023 15:19 |
| Last Modified: | 25 Sep 2024 16:06 |
| Cite in APA 7: | Boudjella, A., Jin, Z.-F., & Savaria, Y. (2003, October). Electrical field analysis of nanoscaled field effect transistors [Paper]. International Microprocesses and Nanotechnology Conference, Tokyo, Japan. https://doi.org/10.1109/imnc.2003.1268735 |
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