Documents dont l'auteur est "Groleau, R."

1986

Groleau, R., Currie, J. F., Wertheimer, M. R., Sapieha, J.-E., & Ke-Ming, W. (1986). Chemical characterization of plasma-polymerized hexamethyldisilazane by nuclear elastic recoil detection. Thin Solid Films, 136(1), 85-92. Lien externe

1985

Brebner, J. L., Cochrane, R. W., Groleau, R., Gujrathi, S., Kéroack, D., Lépine, Y., Martin, J.-P., Vanaček, M., Aktik, C., Aktik, M., Azelmad, A., Currie, J. F., Poulin-Dandurand, S., Ranchoux, B., Sacher, E., Tannous, C., Wertheimer, M. R., & Yelon, A. (1985). Progress in amorphous-silicon photovoltaic-device research. Canadian Journal of Physics, 63(6), 786-797. Lien externe

1984

Sacher, E., Sapieha, J.-E., Wertheimer, M. R., Schreiber, H. P., & Groleau, R. (1984). Surface contributions to the two-layer structure in the plasma deposition of a-Si : H. Philosophical Magazine Part B, 49(4), L47-L52. Lien externe

1983

Currie, J. F., Depelsenaire, P., Huot, J. P., Paquin, L., Wertheimer, M. R., Yelon, A., Brassard, C., L'Ecuyer, J., Groleau, R., & Martin, J. P. (1983). Compositional characterization of microwave plasma a-Si: H films. Canadian Journal of Physics, 61(4), 582-590. Lien externe

1981

Brassard, C., Groleau, R., L'Écuyer, J., Martin, J., Currie, J. F., Depelsenaire, P., Wertheimer, M. R., & Yelon, A. (1981). Nuclear Scattering Measurements of Composition Profiles IN a-Si : H Multilayer Structures. Journal de Physique Colloques, 42(C4), 795-798. Lien externe