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Nuclear Scattering Measurements of Composition Profiles IN a-Si : H Multilayer Structures

C. Brassard, R. Groleau, J. L'Écuyer, J. Martin, John F. Currie, P. Depelsenaire, Michael R. Wertheimer and Arthur Yelon

Article (1981)

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Department: Department of Engineering Physics
PolyPublie URL: https://publications.polymtl.ca/38145/
Journal Title: Journal de Physique Colloques (vol. 42, no. C4)
Publisher: EDP Sciences
DOI: 10.1051/jphyscol:19814174
Official URL: https://doi.org/10.1051/jphyscol%3a19814174
Date Deposited: 18 Apr 2023 15:26
Last Modified: 05 Apr 2024 11:32
Cite in APA 7: Brassard, C., Groleau, R., L'Écuyer, J., Martin, J., Currie, J. F., Depelsenaire, P., Wertheimer, M. R., & Yelon, A. (1981). Nuclear Scattering Measurements of Composition Profiles IN a-Si : H Multilayer Structures. Journal de Physique Colloques, 42(C4), 795-798. https://doi.org/10.1051/jphyscol%3a19814174

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