C. Brassard, R. Groleau, J. L'Écuyer, J. Martin, John F. Currie, P. Depelsenaire, Michael R. Wertheimer
and Arthur Yelon
Article (1981)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/38145/ |
| Journal Title: | Journal de Physique Colloques (vol. 42, no. C4) |
| Publisher: | EDP Sciences |
| DOI: | 10.1051/jphyscol:19814174 |
| Official URL: | https://doi.org/10.1051/jphyscol%3a19814174 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 25 Sep 2024 16:22 |
| Cite in APA 7: | Brassard, C., Groleau, R., L'Écuyer, J., Martin, J., Currie, J. F., Depelsenaire, P., Wertheimer, M. R., & Yelon, A. (1981). Nuclear Scattering Measurements of Composition Profiles IN a-Si : H Multilayer Structures. Journal de Physique Colloques, 42(C4), 795-798. https://doi.org/10.1051/jphyscol%3a19814174 |
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