John F. Currie, P. Depelsenaire, J. P. Huot, L. Paquin, Michael R. Wertheimer
, Arthur Yelon, C. Brassard, J. L'Ecuyer, R. Groleau and J. P. Martin
Article (1983)
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| Department: | Department of Engineering Physics |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/38151/ |
| Journal Title: | Canadian Journal of Physics (vol. 61, no. 4) |
| Publisher: | Canadian Science Publishing |
| DOI: | 10.1139/p83-073 |
| Official URL: | https://doi.org/10.1139/p83-073 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 25 Sep 2024 16:22 |
| Cite in APA 7: | Currie, J. F., Depelsenaire, P., Huot, J. P., Paquin, L., Wertheimer, M. R., Yelon, A., Brassard, C., L'Ecuyer, J., Groleau, R., & Martin, J. P. (1983). Compositional characterization of microwave plasma a-Si: H films. Canadian Journal of Physics, 61(4), 582-590. https://doi.org/10.1139/p83-073 |
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