Claude Thibeault, Yvon Savaria
, Jean-Louis Houle
Article (1992)
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Journal Title
:
Journal of Electronic Testing
(
vol.
3
,
no.
1
)
Publisher:
Springer Science+Business Media
DOI:
Official URL:
OAI:
oai:publications.polymtl.ca:55314
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Date Deposited:
03 Oct 2023 10:23
Last Modified:
02 Oct 2026 23:52
Cite in APA 7:
Thibeault, C., Savaria, Y., & Houle, J.-L. (1992). Test quality of hierarchical defect-tolerant integrated circuits. Journal of Electronic Testing, 3(1), 93-102. https://doi.org/10.1007/bf00159834
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